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  The atomic force microscope as a tool to study and manipulate local surface properties

Jaschke, M., Butt, H. J., Manne, S., Gaub, H. E., Hasemann, O., Krimphove, F., et al. (1996). The atomic force microscope as a tool to study and manipulate local surface properties. Biosensors and Bioelectronics, 11(6-7), 601-612. doi:10.1016/0956-5663(96)83295-7.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0007-5C94-B Version Permalink: https://hdl.handle.net/21.11116/0000-0007-5C95-A
Genre: Journal Article

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 Creators:
Jaschke, Manfred1, Author           
Butt, Hans J.1, Author           
Manne, Srin2, Author
Gaub, Hermann E.2, Author
Hasemann, Olaf3, Author
Krimphove, Frank3, Author
Wolff, Elmar K.3, Author
Affiliations:
1Department of Biophysical Chemistry, Max Planck Institute of Biophysics, Max Planck Society, ou_2068289              
2Technische Universität, 85748 Garching, Germany, ou_persistent22              
3Institut für Technologieentwicklung und Systemanalyse, 58453 Witten, Germany, ou_persistent22              

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 Abstract: The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

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Language(s): eng - English
 Dates: 1998-09-101996-06
 Publication Status: Issued
 Pages: 12
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/0956-5663(96)83295-7
 Degree: -

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Title: Biosensors and Bioelectronics
  Other : Biosens. Bioelectron.
Source Genre: Journal
 Creator(s):
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Publ. Info: Amsterdam u. a. : Elsevier
Pages: - Volume / Issue: 11 (6-7) Sequence Number: - Start / End Page: 601 - 612 Identifier: ISSN: 0956-5663
CoNE: https://pure.mpg.de/cone/journals/resource/954925577034