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  X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique

Schedel-Niedrig, T. (1998). X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique. Fresenius' Journal of Analytical Chemistry, 361, 680-682. doi:10.1007/s002160050990.

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 Creators:
Schedel-Niedrig, Thomas1, Author           
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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 Abstract: Small chromium oxide particles (Cr2O3, CrO2) supported on titanium dioxide and oxidized Ag(111) single crystals were investigated by X-ray absorption spectroscopy at the oxygen K-edge. The spectra were collected in the electron yield mode in order to increase the surface sensitivity. The shape of the sharp split White line (WL) in the O K-edges spectra depended strongly on the oxidation state of the chromium ions in the probed samples suggesting that the WL can be used as an indicator of different environments in the supported chromium oxide films. On the other hand, the O K-edges of the oxidized Ag(111) crystal indicated that the formation of the distinct oxygen species at the surface and in the near-surface region was accompanied by a different silver-to-oxygen covalent interaction.

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Language(s): eng - English
 Dates: 1997-12-221997-07-151997-12-291998-08
 Publication Status: Issued
 Pages: 3
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1007/s002160050990
 Degree: -

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Title: Fresenius' Journal of Analytical Chemistry
  Abbreviation : Fresenius. J. Anal. Chem.
Source Genre: Journal
 Creator(s):
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Publ. Info: Berlin : Springer International
Pages: 3 Volume / Issue: 361 Sequence Number: - Start / End Page: 680 - 682 Identifier: ISSN: 0937-0633
CoNE: https://pure.mpg.de/cone/journals/resource/954928484272