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  Shock damage analysis in serial femtosecond crystallography data collected at MHz X-ray free-electron lasers

Gorel, A., Grünbein, M. L., Bean, R., Bielecki, J., Hilpert, M., Cascella, M., et al. (2020). Shock damage analysis in serial femtosecond crystallography data collected at MHz X-ray free-electron lasers. Crystals, 10(12): 1145, pp. 1-12. doi:10.3390/cryst10121145.

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 Urheber:
Gorel, Alexander1, Autor           
Grünbein, Marie Luise1, Autor           
Bean, Richard, Autor
Bielecki, Johan, Autor
Hilpert, Mario1, Autor           
Cascella, Michele, Autor
Colletier, Jacques-Philippe, Autor
Fangohr, Hans, Autor
Foucar, Lutz1, Autor           
Hartmann, Elisabeth1, Autor           
Hunter, Mark S., Autor
Kirkwood, Henry, Autor
Kloos, Marco1, Autor           
Letrun, Romain, Autor
Michelat, Thomas, Autor
Shoeman, Robert L.1, Autor           
Sztuk-Dambietz, Jolanta, Autor
Tetreau, Guillaume, Autor
Zimmermann, Herbert1, Autor           
Mancuso, Adrian P., Autor
Barends, Thomas R.M.1, Autor           Doak, R. Bruce1, Autor           Stan, Claudiu Andrei, AutorSchlichting, Ilme1, Autor            mehr..
Affiliations:
1Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Max Planck Society, ou_1497700              

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Schlagwörter: X-ray free-electron laser; serial femtosecond crystallography; shock wave; protein crystallography
 Zusammenfassung: Serial femtosecond crystallography (SFX) data were recorded at the European X-ray free-electron laser facility (EuXFEL) with protein microcrystals delivered via a microscopic liquid jet. An XFEL beam striking such a jet may launch supersonic shock waves up the jet, compromising the oncoming sample. To investigate this efficiently, we employed a novel XFEL pulse pattern to nominally expose the sample to between zero and four shock waves before being probed. Analyzing hit rate, indexing rate, and resolution for diffraction data recorded at MHz pulse rates, we found no evidence of damage. Notably, however, this conclusion could only be drawn after careful identification and assimilation of numerous interrelated experimental factors, which we describe in detail. Failure to do so would have led to an erroneous conclusion. Femtosecond photography of the sample-carrying jet revealed critically different jet behavior from that of all homogeneous liquid jets studied to date in this manner.

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Sprache(n): eng - English
 Datum: 2020-12-112020-12-012020-12-132020-12-16
 Publikationsstatus: Online veröffentlicht
 Seiten: 12
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.3390/cryst10121145
 Art des Abschluß: -

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Titel: Crystals
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Basel, Switzerland : MDPI AG
Seiten: - Band / Heft: 10 (12) Artikelnummer: 1145 Start- / Endseite: 1 - 12 Identifikator: ISSN: 2073-4352
CoNE: https://pure.mpg.de/cone/journals/resource/2073-4352