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  Effect of surface roughness of carbon support films on high-resolution electron diffraction of two-dimensional protein crystals

Butt, H.-J., Wang, D., Hansma, P., & Kühlbrandt, W. (1991). Effect of surface roughness of carbon support films on high-resolution electron diffraction of two-dimensional protein crystals. Ultramicroscopy, 36(4), 307-318. doi:10.1016/0304-3991(91)90123-N.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0007-ABE1-A Version Permalink: http://hdl.handle.net/21.11116/0000-0007-ABE2-9
Genre: Journal Article

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 Creators:
Butt, Hans-Jürgen1, Author              
Wang, D.N.2, Author
Hansma, P.K.3, Author
Kühlbrandt, Werner2, Author              
Affiliations:
1Transport Proteins Group, Max Planck Institute of Biophysics, Max Planck Society, ou_3273415              
2European Molecular Biology Laboratory, 6900 Heidelberg, Germany, ou_persistent22              
3Department of Physics, University of California, Santa Barbara, CA 93106, USA, ou_persistent22              

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 Abstract: The surface roughness of carbon films, which are used as a specimen support in high-resolution electron microscopy, has been investigated by atomic force microscopy. Carbon films were prepared by evaporating carbon onto mica. We found that the carbon surface that had been in contact with the mica was between 3 and 9 times smoother than the surface which had faced the carbon source. Surfaces of carbon films prepared by multiple evaporation were smoother than films evaporated in a single step. The surface roughness on the mica side of these films was close to that of mica. Two-dimensional crystals of plant light-harvesting complex yielded isotropically sharp high-resolution electron diffraction patterns at high tilt angles only when supported on the smoothest carbon films, produced by multiple evaporation.

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Language(s): eng - English
 Dates: 1990-09-301991-03-182002-08-191991-09-01
 Publication Status: Published in print
 Pages: 12
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/0304-3991(91)90123-N
 Degree: -

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Title: Ultramicroscopy
  Abbreviation : Ultramicroscopy
Source Genre: Journal
 Creator(s):
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Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 36 (4) Sequence Number: - Start / End Page: 307 - 318 Identifier: ISSN: 0304-3991
CoNE: https://pure.mpg.de/cone/journals/resource/954925512451