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  Dynamic Effects in Voltage Pulsed Atom Probe

Rousseau, L., Normand, A., Morgado, F. F., Stephenson, L., Gault, B., Tehrani, K., et al. (2020). Dynamic Effects in Voltage Pulsed Atom Probe. Microscopy and Microanalysis, 26(6), 1133-1146. doi:10.1017/S1431927620024587.

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 Creators:
Rousseau, Loïc1, 2, Author              
Normand, Antoine2, Author              
Morgado, Felipe Ferraz3, Author              
Stephenson, Leigh3, Author              
Gault, Baptiste3, 4, Author              
Tehrani, Kambiz1, Author              
Vurpillot, François5, Author              
Affiliations:
1ESIGELEC, Avenue Galilée, Saint Etienne du Rouvray, Normandie 76800, France, ou_persistent22              
2Groupe Physique des Matériaux, Université de Rouen, Saint Etienne du Rouvray, Normandie 76800, France, ou_persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
4Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22              
5Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000, Rouen, France, ou_persistent22              

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Language(s): eng - English
 Dates: 2020-11-122020-12-06
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1017/S1431927620024587
 Degree: -

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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 26 (6) Sequence Number: - Start / End Page: 1133 - 1146 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414