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  Measurement of an excitonic wave function

Dong, S., Puppin, M., Pincelli, T., Beaulieu, S., Christiansen, D., Hubener, H., et al. (in preparation). Measurement of an excitonic wave function.

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2012.15328.pdf (Preprint), 26MB
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2012.15328.pdf
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arXiv:2012.15328v2 [cond-mat.mtrl-sci] 4 May 2021
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 Creators:
Dong, Shuo1, Author           
Puppin, Michele1, 2, Author           
Pincelli, Tommaso1, Author           
Beaulieu, Samuel1, Author           
Christiansen, Dominik3, Author
Hubener, Hannes4, Author
Nicholson, Christopher1, 5, Author           
Xian, R. Patrick1, Author           
Dendzik, Maciej Ramon1, 6, Author           
Deng, Yunpei1, 7, Author           
Windsor, Yaov William1, Author           
Selig, Malte3, Author
Malic, Ermin8, Author
Rubio, Angel4, Author
Knorr, Andreas3, Author
Wolf, Martin1, Author           
Rettig, Laurenz, Author
Rettig, Laurenz1, Author           
Ernstorfer, Ralph1, Author           
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              
2Laboratoire de Spectroscopie Ultrarapide and Lausanne Centre for Ultrafast Science (LACUS), Ecole polytechnique federale de Lausanne, ISIC, Station 6, CH-1015 Lausanne, Switzerland, ou_persistent22              
3Institut für Theoretische Physik, Nichtlineare Optik und Quantenelektronik, Technische Universität Berlin, 10623 Berlin, Germany, ou_persistent22              
4Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, Luruper Chaussee 149, Geb. 99 (CFEL), 22761 Hamburg, DE, ou_1938284              
5Departement de Physique and Fribourg Center for Nanomaterials, Universite de Fribourg, CH-1700 Fribourg, Switzerland, ou_persistent22              
6Department of Applied Physics, KTH Royal Institute of Technology, Hannes Alfvens väg 12, 114 19 Stockholm, Sweden, ou_persistent22              
7SwissFEL, Paul Scherrer Institute, Villigen, Switzerland, ou_persistent22              
8Chalmers University of Technology, Department of Physics, 412 96 Gothenburg, Sweden, ou_persistent22              

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Free keywords: Condensed Matter, Materials Science, cond-mat.mtrl-sci
 Abstract: Excitons, Coulomb-bound electron-hole pairs, are the fundamental excitations governing optoelectronic properties of semiconductors. While optical signatures of excitons have been studied extensively, experimental access to the excitonic wave function itself has been elusive. Using multidimensional photoemission
spectroscopy, we present a momentum-, energy- and time-resolved perspective on
excitons in the layered semiconductor WSe2. By tuning the excitation
wavelength, we determine the energy-momentum signature of bright exciton
formation and its difference from conventional single-particle excited states.
The multidimensional data allows to retrieve fundamental exciton properties like the binding energy and the exciton-lattice coupling and to reconstruct the real-space excitonic wave function via Fourier transform. All quantities are in excellent agreement with microscopic calculations. Our approach provides a full characterization of the exciton wave function and is applicable to bright and dark excitons in semiconducting materials, heterostructures and devices.

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Language(s): eng - English
 Dates: 2020-12-30
 Publication Status: Not specified
 Pages: 43
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: arXiv: 2012.15328
URI: https://arxiv.org/abs/2012.15328
 Degree: -

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