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  Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography

Jenkins, B. M., Danoix, F., Gouné, M., Bagot, P. A. J., Peng, Z., Moody, M. P., et al. (2020). Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography. Microscopy and Microanalysis, 26(2), 247-257. doi:10.1017/S1431927620000197.

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 Creators:
Jenkins, Benjamin M.1, Author              
Danoix, Frédéric2, Author              
Gouné, Mohamed3, Author              
Bagot, Paul Alexander J.4, Author              
Peng, Zirong5, Author              
Moody, Michael P.1, Author              
Gault, Baptiste6, 7, Author              
Affiliations:
1Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22              
2Normandie Univ, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen76000, France, ou_persistent22              
3Institut de la Matière Condensée de Bordeaux (ICMCB), CNRS, Université de Bordeaux, Bordeaux, France, ou_persistent22              
4Department of Materials, University of Oxford, Oxford, UK, ou_persistent22              
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
6Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
7Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22              

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Language(s): eng - English
 Dates: 2020-03-182020-04-02
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1017/S1431927620000197
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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Pages: - Volume / Issue: 26 (2) Sequence Number: - Start / End Page: 247 - 257 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414