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  Impact of operational parameters on single beamlet deflection in a negative ion source for NBI applications

Hurlbatt, A., Bonomo, F., Orozco, G., Nocentini, R., & Wimmer, C. (2020). Impact of operational parameters on single beamlet deflection in a negative ion source for NBI applications. Talk presented at 7th International Symposium on Negative Ions, Beams and Sources (NIBS 2020) (Virtual). 2020-09-01 - 2020-09-10.

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 Creators:
Hurlbatt, A.1, Author              
Bonomo, F.1, Author              
Orozco, G.1, Author              
Nocentini, R.1, Author              
Wimmer, C.1, Author              
Affiliations:
1ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856290              

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Language(s): eng - English
 Dates: 2020
 Publication Status: Submitted
 Pages: -
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Title: 7th International Symposium on Negative Ions, Beams and Sources (NIBS 2020) (Virtual)
Place of Event: -
Start-/End Date: 2020-09-01 - 2020-09-10

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