Impact of operational parameters on single beamlet deflection in a negative ion 
source for NBI applications

Hurlbatt, A.; Bonomo, F.; Orozco, G.; Nocentini, R.; Wimmer, C.

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Impact of operational parameters on single beamlet deflection in a negative ion source for NBI applications

Hurlbatt, A., Bonomo, F., Orozco, G., Nocentini, R., & Wimmer, C. (2020). Impact of operational parameters on single beamlet deflection in a negative ion source for NBI applications. Talk presented at 7th International Symposium on Negative Ions, Beams and Sources (NIBS 2020) (Virtual). 2020-09-01 - 2020-09-10.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0007-E06A-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0007-E096-2

Genre: Talk

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Creators:
Hurlbatt, A.¹, Author
Bonomo, F.¹, Author
Orozco, G.¹, Author
Nocentini, R.¹, Author
Wimmer, C.¹, Author

Affiliations:
1ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856290

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Language(s): eng - English

Dates: Submitted: 2020

Publication Status: Submitted

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Title: 7th International Symposium on Negative Ions, Beams and Sources (NIBS 2020) (Virtual)

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Start-/End Date: 2020-09-01 - 2020-09-10

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