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  Artifacts in Force Measurements with the Atomic Force Microscope Due to Digitalization

Siedle, P., & Butt, H.-J. (1995). Artifacts in Force Measurements with the Atomic Force Microscope Due to Digitalization. Langmuir, 11(4), 1065-1067. doi:10.1021/la00004a005.

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 Creators:
Siedle, Peter1, Author           
Butt, Hans-Jürgen1, Author           
Affiliations:
1Department of Biophysical Chemistry, Max Planck Institute of Biophysics, Max Planck Society, ou_2068289              

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 Abstract: The atomic force microscope has become a standard tool to measuee surface forces. Force-versus-distance curvss taken with an atomic force microscope often show a hysteresis in the noncontact region between approach and retraction. The hysteresis can be caused by the discrete, stepwise motion of the sample due to digitalization. Since in the presence of liquids cantilever and sample are coupled, the cantilever oscillates after each step. Depending on when a data point is recorded during this oscillation, the amplitude of the cantilever deflection measured may deviate from the equilibrium value. This might cause a hysteresis and other misleading results in force-versus-distance measurements. Especially when attractive forces are measured, cantilever oscillations can severely change the results

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Language(s): eng - English
 Dates: 1995-02-141994-11-292002-051995-04-01
 Publication Status: Published in print
 Pages: 3
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1021/la00004a005
 Degree: -

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Title: Langmuir
  Abbreviation : Langmuir
Source Genre: Journal
 Creator(s):
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Publ. Info: Columbus, OH : American Chemical Society
Pages: - Volume / Issue: 11 (4) Sequence Number: - Start / End Page: 1065 - 1067 Identifier: ISSN: 0743-7463
CoNE: https://pure.mpg.de/cone/journals/resource/954925541194