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  Correction and Verification of XICS Analysis on W7-X Through X-Ray Ray Tracing

Pablant, N., Langenberg, A., Alonso, A., Bitter, M., Bozhenkov, S., Ford, O., et al. (2020). Correction and Verification of XICS Analysis on W7-X Through X-Ray Ray Tracing. Poster presented at 23rd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2020), Virtual.

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 Creators:
Pablant, N.1, Author
Langenberg, A.2, Author           
Alonso, A.1, Author
Bitter, M.1, Author
Bozhenkov, S.2, Author           
Ford, O.2, Author           
Hill, K. W.1, Author
Kring, J.1, Author
Marchuk, O.1, Author
Svensson, J.3, Author           
Traverso, P.1, Author
Windisch, T.3, Author           
Yakusevitch, Y.1, Author
W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author              
Affiliations:
1External Organizations, ou_persistent22              
2Stellarator Heating and Optimisation (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040305              
3Stellarator Dynamics and Transport (E5), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040306              

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Language(s): eng - English
 Dates: 2020
 Publication Status: Submitted
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 23rd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2020)
Place of Event: Virtual
Start-/End Date: 2020-12-14 - 2020-12-17

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