English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Einführung in die Rasterelektronenmikroskopie

Stroth, U., Balden, M., Dörsch, G., & Kremer, K. (2021). Einführung in die Rasterelektronenmikroskopie. Praktikum (WS 2020/2021). Technische Universität München.

Item is

Basic

show hide
Genre: Teaching
Other : Introduction to Scanning Electron Microscopy

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Stroth, U.1, Author              
Balden, M.1, Author              
Dörsch, G.1, Author              
Kremer, K.1, Author              
Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2021
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: Praktikum (WS 2020/2021)
Place of Event: Technische Universität München
Start-/End Date: -

Legal Case

show

Project information

show

Source

show