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  SiO2/Si(001) studied by time-resolved valence band photoemission at MHz repetition rates: Linear and nonlinear excitation of surface photovoltage

Kamrla, R., Trützschler, A., Huth, M., Chiang, C.-T., Schumann, F. O., & Widdra, W. (2019). SiO2/Si(001) studied by time-resolved valence band photoemission at MHz repetition rates: Linear and nonlinear excitation of surface photovoltage. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 37(2): 021101. doi:10.1116/1.5082188.

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1.5082188.pdf (Publisher version), 768KB
 
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https://doi.org/10.1116/1.5082188 (Publisher version)
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Kamrla, Robin1, Author
Trützschler, Andreas1, Author
Huth, Michael1, Author
Chiang, Cheng-Tien1, Author
Schumann, Frank O.1, Author              
Widdra, Wolf1, Author
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1Max Planck Institute of Microstructure Physics, Max Planck Society, ou_2415691              

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 Abstract: The authors investigate the fluence and doping dependence of the surface photovoltage (SPV) shifts at SiO2/Si(001) interfaces by time-resolved photoelectron spectroscopy. Charge carriers are excited by pumping photon energies of hνpump = 1.2 and 2.4 eV and probed by high-order harmonics of hνprobe = 22.6 eV at 0.2 and 0.7 MHz repetition rates. The authors observe SPV shifts of the non-bonding O2p state by 240 meV for SiO2/p-Si and by -140 meV for SiO2/n-Si upon pumping with hνpump = 1.2 eV, and their decay rate is estimated from time-resolved measurements. Moreover, the authors observe a striking pumping fluence dependence of SPV at these interfaces, which indicates charge carrier generation by both linear and nonlinear optical excitations.

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 Dates: 2019-02-012019-03
 Publication Status: Published in print
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 Identifiers: BibTex Citekey: P13760
DOI: 10.1116/1.5082188
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Title: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films
  Other : J. Vac. Sci. Technol. A: Vac. Surf. Films
Source Genre: Journal
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Publ. Info: New York : Published by AVS through the American Institute of Physics
Pages: - Volume / Issue: 37 (2) Sequence Number: 021101 Start / End Page: - Identifier: ISSN: 0734-2101
CoNE: https://pure.mpg.de/cone/journals/resource/954928495416_2