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  Lock-in thermography for analyzing solar cells and failure analysis in other electronic components

Breitenstein, O., & Sturm, S. (2018). Lock-in thermography for analyzing solar cells and failure analysis in other electronic components. In Proceedings 14th Quantitative InfraRed Thermography Conference, Quantitative Infrared Thermography (pp. 235-242). doi:10.21611/qirt.2018.b.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-28E2-B Version Permalink: https://hdl.handle.net/21.11116/0000-000F-CBD2-F
Genre: Conference Paper

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2018
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https://doi.org/10.21611/qirt.2018.b (Publisher version)
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 Creators:
Breitenstein, O.1, Author
Sturm, S.2, Author
Affiliations:
1Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society, Weinberg 2, 06120 Halle, DE, ou_3287476              
2External Organizations, ou_persistent22              

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 Abstract: Lock-in thermography (LIT) is a dynamic variant of infrared thermography, where local heat sources are periodically pulsed and amplitude and phase images of the surface temperature modulation are obtained. If used in electronic device testing, this method enables the localization of very weak local heat sources below the surface. This contribution reviews the basics and application of LIT for local efficiency analysis of solar cells and for failure analysis in other electronic components like bare and encapsulated integrated circuits. In both application fields LIT has established as a reliable and easy-to-use standard method for failure analysis.

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 Dates: 2018-06
 Publication Status: Published online
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 Identifiers: BibTex Citekey: P13336
DOI: 10.21611/qirt.2018.b
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Title: 14th International Conference on Quantitative Infrared Thermography (QIRT 2018)
Place of Event: Berlin
Start-/End Date: 2018-06-25 - 2018-06-29

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Title: Proceedings 14th Quantitative InfraRed Thermography Conference, Quantitative Infrared Thermography
Source Genre: Proceedings
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Pages: - Volume / Issue: 2019-05 Sequence Number: - Start / End Page: 235 - 242 Identifier: -