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  SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II

Fink, R., Weiss, M., Umbach, E., Preikszas, D., Rose, H., Spehr, R., et al. (1997). SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II. Journal of Electron Spectroscopy and Related Phenomena, 84(1-3), 231-250. doi:10.1016/S0368-2048(97)00016-9.

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 Creators:
Fink, Rainer1, Author
Weiss, M.R.1, Author
Umbach , E.1, Author
Preikszas, D.2, Author
Rose, H.2, Author
Spehr, R.2, Author
Hartel, P.2, Author
Engel, Wilfried3, Author           
Degenhardt, Ralf4, Author           
Wichtendahl, Ralph3, Author           
Kuhlenbeck, Helmut5, Author           
Erlebach, Wolfgang3, Author           
Ihmann, Klaus4, Author           
Schlögl, Robert4, Author           
Freund, Hans-Joachim5, Author           
Bradshaw, Alexander M.3, Author           
Lilienkamp, G.6, Author
Schmidt, Th.6, Author
Bauer, D.6, Author
Benner, G.7, Author
Affiliations:
1Universität Würzburg, Experimentelle Physik II, Am Hubland, 97074 Würzburg, Germany, ou_persistent22              
2Technische Hochschule Darmstadt, Angewandte Physik, Hochschulstraße 6, 64289 Darmstadt, Germany, ou_persistent22              
3Fritz Haber Institute, Max Planck Society, ou_24021              
4Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
5Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              
6Technische Universität Clausthal, Leibnizstr. 4, 38678 Clausthal-Zellerfeld, Germany, ou_persistent22              
7LEO Elektronenmikroskopie GmbH, 73446 Oberkochen, Germany, ou_persistent22              

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 Abstract: A new UHV spectromicroscope called SMART (spectromicroscope for all relevant techniques) is currently under construction for a soft X-ray undulator beamline at BESSY II. The instrument consists of a plane-grating monochromator with an aspherical focusing mirror and an ultrahigh-resolution, low-energy electron microscope containing an energy filter. It can be used as a photoemission microscope for a variety of electron spectroscopies (XAS, XPS, UPS, XAES) and has a calculated spatial resolution of better than 1 nm. A maximum energy resolution of about 0.1 eV will be provided by a corrected omega filter. The high lateral resolution of the electron microscope will be achieved through the correction of the chromatic and spherical aberrations of the objective lens by means of an electrostatic mirror in combination with a corrected magnetic beam separator. An additional electron source placed on the other side of the beam separator opposite the electrostatic mirror will also allow LEEM, MEM and small-spot LEED investigations to be carried out. The basic ideas, the various modes of operation and the electron optical design of the instrument are outlined.

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Language(s): eng - English
 Dates: 1996-06-191997-01-021997-03-01
 Publication Status: Published in print
 Pages: 20
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/S0368-2048(97)00016-9
 Degree: -

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Title: Journal of Electron Spectroscopy and Related Phenomena
  Abbreviation : J. Electron Spectrosc. Relat. Phenom.
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B.V.
Pages: 20 Volume / Issue: 84 (1-3) Sequence Number: - Start / End Page: 231 - 250 Identifier: ISSN: 0368-2048
CoNE: https://pure.mpg.de/cone/journals/resource/954925524767