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  Inelastic electron scattering by the gas phase in near ambient pressure XPS measurements

Pielsticker, L., Nicholls, R., Beeg, S., Hartwig, C., Klihm, G., Schlögl, R., et al. (2021). Inelastic electron scattering by the gas phase in near ambient pressure XPS measurements. Surface and Interface Analysis, 53(7), 605-617. doi:10.1002/sia.6947.

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 Creators:
Pielsticker, Lukas1, Author
Nicholls, Rachel1, Author
Beeg, Sebastian1, Author
Hartwig, Caroline1, Author
Klihm, Gudrun1, Author
Schlögl, Robert1, 2, Author           
Tougaard, Sven3, Author
Greiner, Mark1, Author
Affiliations:
1Department of Heterogeneous Reactions, Max Plank Institute for Chemical Energy Conversion, Mülheim an der Ruhr, Germany, ou_persistent22              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Department of Physics, Chemistry and Pharmacy, University of Southern Denmark, Odense, Denmark, ou_persistent22              

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 Abstract: X‐ray photoemission spectroscopy (XPS) measurements in near‐ambient pressure (NAP) conditions result in a signal loss of the primary spectrum as a result of inelastic scattering of photoelectrons in the gas phase. The inelastic scattering of the primary electrons gives rise to a secondary signal that can result in additional and often unwanted features in the measured spectrum. In the present work, we derive equations that can be used to model the resulting signal and provide equations that can be used to simulate or remove the inelastic scattering signal from measured spectra. We demonstrate this process for photoemission spectra of a wide range of kinetic energies, measured from Au, Ag, and Cu, in a variety of gases (N2, He, H2, and O2). The work is supplemented with an open‐source software in which the algorithms described here have been implemented and can be used to remove the gas phase inelastic scattering signal.

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Language(s): eng - English
 Dates: 2021-01-062021-03-132021-05-072021-07
 Publication Status: Issued
 Pages: 13
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1002/sia.6947
 Degree: -

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Title: Surface and Interface Analysis
  Abbreviation : Surf. Interface Anal.
Source Genre: Journal
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Publ. Info: New York, NY : John Wiley & Sons
Pages: 13 Volume / Issue: 53 (7) Sequence Number: - Start / End Page: 605 - 617 Identifier: ISSN: 0142-2421
CoNE: https://pure.mpg.de/cone/journals/resource/954925471358