Nanocrystalline silicon with twin faults and reduced Debye temperature

Vogel, Walter; Botti, S.; Martelli, S.

doi:10.1023/A:1006505200323

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Nanocrystalline silicon with twin faults and reduced Debye temperature

Vogel, W., Botti, S., & Martelli, S. (1998). Nanocrystalline silicon with twin faults and reduced Debye temperature. Journal of Materials Science Letters, 17, 527-529. doi:10.1023/A:1006505200323.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0008-B4E3-C Version Permalink: https://hdl.handle.net/21.11116/0000-0008-B4E4-B

Genre: Journal Article

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Creators:
Vogel, Walter¹, Author
Botti, S.², Author
Martelli, S.², Author

Affiliations:
1Fritz Haber Institute, Max Planck Society, ou_24021
2ENEA, Dip. Innovatione, Settore Fisica Applicata, entro Ricerche Frascati, Italy, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 1998-04

Publication Status: Issued

Pages: 3

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: DOI: 10.1023/A:1006505200323

Degree: -

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Title: Journal of Materials Science Letters

Source Genre: Journal

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Publ. Info: London : Chapman and Hall

Pages: 3 Volume / Issue: 17 Sequence Number: - Start / End Page: 527 - 529 Identifier: ISSN: 0261-8028
CoNE: https://pure.mpg.de/cone/journals/resource/954925415936