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  Shell-wise oxidation of nanocrystalline silicon observed by X-ray diffraction and TEM

Vogel, W., Botti, S., Martelli, S., & Carlino, E. (1998). Shell-wise oxidation of nanocrystalline silicon observed by X-ray diffraction and TEM. New Journal of Chemistry, 22(7), 749-752. doi:10.1039/A709239C.

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アイテムのパーマリンク: https://hdl.handle.net/21.11116/0000-0008-B4DE-3 版のパーマリンク: https://hdl.handle.net/21.11116/0000-0008-DD82-C
資料種別: 学術論文

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 作成者:
Vogel, Walter1, 著者           
Botti, Sabina2, 著者
Martelli, Stefano2, 著者
Carlino, Elvio3, 著者
所属:
1Fritz Haber Institute, Max Planck Society, ou_24021              
2ENEA, Dip.Innovatione, Settore Fisica Applicata, Centro Ricerche Frascati, Italy, ou_persistent22              
3PAST IS-Centro Nazionale Ricerca e Sviluppo Materiali (PAST IS-CNRSM), Italy, ou_persistent22              

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 要旨: The oxidation of nanocrystalline silicon powder (average crystallite size of 87 Å), prepared by laser-driven pyrolysis of SiH4, has been studied by X-ray diffraction and transmission electron microscopy. In a previous study the Si particles were shown to form perfect isolated near-spherical ‘single crystals’ that are stable up to 1073 K under high vacuum conditions. We have measured the size reduction of the Si nanoparticles in a flow of oxygen as a function of the degree of oxidation. The results are in agreement with model calculations for a shell-wise oxidation of silicon surface layers to amorphous silicon oxide. An oxidation to 50 vol.% implies a size reduction of 20% and tenfold improved visible photoluminescence intensity. Preliminary kinetic studies at 656 Kin oxygen indicate a self-limiting type of oxidation, which is reached for an oxide layer thickness of ≈6.8 Å

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言語: eng - English
 日付: 1997-10-211998
 出版の状態: 出版
 ページ: 4
 出版情報: -
 目次: -
 査読: 査読あり
 識別子(DOI, ISBNなど): DOI: 10.1039/A709239C
 学位: -

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出版物 1

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出版物名: New Journal of Chemistry
  省略形 : New J. Chem.
種別: 学術雑誌
 著者・編者:
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出版社, 出版地: London : Royal Society of Chemistry
ページ: 4 巻号: 22 (7) 通巻号: - 開始・終了ページ: 749 - 752 識別子(ISBN, ISSN, DOIなど): ISSN: 1144-0546
CoNE: https://pure.mpg.de/cone/journals/resource/954928578776