English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  From epitaxially grown thin films to grain boundary analysis in Cu and Ti

Devulapalli, V., Frommeyer, L., Ghidelli, M., Liebscher, C., & Dehm, G. (2019). From epitaxially grown thin films to grain boundary analysis in Cu and Ti. Poster presented at International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano, Düsseldorf, Germany.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Devulapalli, Vivek1, Author           
Frommeyer, Lena1, Author           
Ghidelli, Matteo2, Author           
Liebscher, Christian1, Author           
Dehm, Gerhard3, Author           
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
2Thin Films and Nanostructured Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_3274276              
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2019-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano
Place of Event: Düsseldorf, Germany
Start-/End Date: 2019-10-27 - 2019-10-30

Legal Case

show

Project information

show

Source

show