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  A Novel Shadowgraphic Inline Measurement Technique for Image-Based Crystal Size Distribution Analysis

Wirz, D., Hofmann, M., Lorenz, H., Bart, H.-J., Seidel-Morgenstern, A., & Temmel, E. (2021). A Novel Shadowgraphic Inline Measurement Technique for Image-Based Crystal Size Distribution Analysis. In E. Temmel, & H. Lorenz (Eds.), Advances in Industrial Crystallization (pp. 131-156). Basel, Switzerland: MDPI.

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 Creators:
Wirz, Dominic1, Author
Hofmann, Marc1, Author
Lorenz, Heike2, Author           
Bart, Hans-Jörg1, Author
Seidel-Morgenstern, Andreas2, 3, Author           
Temmel, Erik2, 4, Author           
Affiliations:
1Chair of Separation Science and Technology, TU Kaiserslautern, Gottlieb-Daimler-Straße, 67663 Kaiserslautern, Germany;, ou_persistent22              
2Physical and Chemical Foundations of Process Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738150              
3Otto-von-Guericke-Universität Magdeburg, External Organizations, ou_1738156              
4Sulzer Chemtech Ltd., Gewerbestraße 28, 4123 Allschwil, Switzerland, ou_persistent22              

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Language(s): eng - English
 Dates: 2021
 Publication Status: Published in print
 Pages: 26
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.3390/cryst10090740
 Degree: -

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Title: Advances in Industrial Crystallization
Source Genre: Book
 Creator(s):
Temmel, Erik, Editor           
Lorenz, Heike, Editor           
Affiliations:
-
Publ. Info: Basel, Switzerland : MDPI
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 131 - 156 Identifier: DOI: 10.3390/books978-3-0365-0331-8
ISBN: 978-3-0365-0331-8
ISBN: 978-3-0365-0330-1