Comprehensive, 5-parameter crystallographic grain boundary characterization and 
its application to thin-film CdTe solar cells

Konijnenberg, Peter Joachim; Stechmann, Guillaume; Zaefferer, Stefan

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Comprehensive, 5-parameter crystallographic grain boundary characterization and its application to thin-film CdTe solar cells

Konijnenberg, P. J., Stechmann, G., & Zaefferer, S. (2013). Comprehensive, 5-parameter crystallographic grain boundary characterization and its application to thin-film CdTe solar cells. Talk presented at IDSC 2013. Düsseldorf, Germany. 2013.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0008-F260-A Version Permalink: https://hdl.handle.net/21.11116/0000-0008-F261-9

Genre: Talk

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Creators:
Konijnenberg, Peter Joachim¹, Author
Stechmann, Guillaume², Author
Zaefferer, Stefan¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Created: 2013

Publication Status: Not specified

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Title: IDSC 2013

Place of Event: Düsseldorf, Germany

Start-/End Date: 2013

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