Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger 
Electron Trajectories

Schroeder, S. L. M.

doi:10.1051/jp4/1997147

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Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger Electron Trajectories

Schroeder, S. L. M. (1997). Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger Electron Trajectories. Journal de Physique IV, 7(C2), C2-153-C2-154. doi:10.1051/jp4/1997147.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0008-F919-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0008-F91A-3

Genre: Journal Article

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Schroeder, S. L. M.^{1, 2}, Author

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1Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, UK, ou_persistent22
2Fritz Haber Institute, Max Planck Society, ou_24021

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Abstract: The signal formation in total electron-yield (TEY) XAS has been modelled for keV absorption edges using a computationally fast Monte-Carlo algorithm for the simulation of the Auger electron trajectories. It is shown that a pure KLL Auger-yield model achieves good agreement with experimental data for the K-edge TEY attenuation in Al and Cu. Advantages of the Monte-Carlo simulation approach over empirical and analytical models for the TEY are pointed out.

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Language(s): eng - English

Dates: Date issued: 1997-04

Publication Status: Issued

Pages: 2

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Rev. Type: Peer

Identifiers: DOI: 10.1051/jp4/1997147

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Title: Journal de Physique IV

Source Genre: Journal

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Publ. Info: Les Ulis, France : Les Editions de physique

Pages: 2 Volume / Issue: 7 (C2) Sequence Number: - Start / End Page: C2-153 - C2-154 Identifier: ISSN: 1155-4339
CoNE: https://pure.mpg.de/cone/journals/resource/954925611967