New techniques for imaging and identifying defects in electron microscopy

Gianola, Daniel S.; Britton, T. Ben; Zaefferer, Stefan

doi:10.1557/mrs.2019.125

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New techniques for imaging and identifying defects in electron microscopy

Gianola, D. S., Britton, T. B., & Zaefferer, S. (2020). New techniques for imaging and identifying defects in electron microscopy. MRS Bulletin, 44, 450-458. doi:10.1557/mrs.2019.125.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-0656-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-0657-F

Genre: Journal Article

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Creators:
Gianola, Daniel S.¹, Author
Britton, T. Ben², Author
Zaefferer, Stefan³, Author

Affiliations:
1Materials Department, University of California, Santa Barbara, USA, ou_persistent22
2Department of Materials, Royal School of Mines, Imperial College London, London, SW7 2AZ, UK, ou_persistent22
3Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Published Online: 2019Date issued: 2020-09-27

Publication Status: Issued

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Identifiers: DOI: 10.1557/mrs.2019.125

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Title: MRS Bulletin

Abbreviation : MRS Bull.

Source Genre: Journal

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Pages: - Volume / Issue: 44 Sequence Number: - Start / End Page: 450 - 458 Identifier: ISSN: 0883-7694
CoNE: https://pure.mpg.de/cone/journals/resource/954925549328