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  New techniques for imaging and identifying defects in electron microscopy

Gianola, D. S., Britton, T. B., & Zaefferer, S. (2020). New techniques for imaging and identifying defects in electron microscopy. MRS Bulletin, 44, 450-458. doi:10.1557/mrs.2019.125.

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 Creators:
Gianola, Daniel S.1, Author              
Britton, T. Ben2, Author              
Zaefferer, Stefan3, Author              
Affiliations:
1Materials Department, University of California, Santa Barbara, USA, ou_persistent22              
2Department of Materials, Royal School of Mines, Imperial College London, London, SW7 2AZ, UK, ou_persistent22              
3Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
 Dates: 20192020-09-27
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1557/mrs.2019.125
 Degree: -

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Title: MRS Bulletin
  Abbreviation : MRS Bull.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 44 Sequence Number: - Start / End Page: 450 - 458 Identifier: ISSN: 0883-7694
CoNE: https://pure.mpg.de/cone/journals/resource/954925549328