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  Unravelling grain boundary structures in Ti thin films using aberration-corrected transmission electron microscopy

Devulapalli, V., Dehm, G., & Liebscher, C. (2020). Unravelling grain boundary structures in Ti thin films using aberration-corrected transmission electron microscopy. Talk presented at MSE Darmdtadt (Virtual). Darmstadt, Germany. 2020-09-22 - 2020-09-25.

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 Creators:
Devulapalli, Vivek1, Author              
Dehm, Gerhard2, Author              
Liebscher, Christian1, Author              
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2020-09
 Publication Status: Not specified
 Pages: -
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Title: MSE Darmdtadt (Virtual)
Place of Event: Darmstadt, Germany
Start-/End Date: 2020-09-22 - 2020-09-25

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