Unravelling grain boundary structures in Ti thin films using 
aberration-corrected transmission electron microscopy

Devulapalli, Vivek; Dehm, Gerhard; Liebscher, Christian

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Unravelling grain boundary structures in Ti thin films using aberration-corrected transmission electron microscopy

Devulapalli, V., Dehm, G., & Liebscher, C. (2020). Unravelling grain boundary structures in Ti thin films using aberration-corrected transmission electron microscopy. Talk presented at MSE Darmdtadt (Virtual). Darmstadt, Germany. 2020-09-22 - 2020-09-25.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-0CC9-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-0CCA-7

Genre: Talk

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Creators:
Devulapalli, Vivek¹, Author
Dehm, Gerhard², Author
Liebscher, Christian¹, Author

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Created: 2020-09

Publication Status: Not specified

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Title: MSE Darmdtadt (Virtual)

Place of Event: Darmstadt, Germany

Start-/End Date: 2020-09-22 - 2020-09-25

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