Microstructure Characterization in 2D and 3D using Advanced SEM-based Electron 
Diffraction Techniques

Zaefferer, Stefan

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Microstructure Characterization in 2D and 3D using Advanced SEM-based Electron Diffraction Techniques

Zaefferer, S. (2019). Microstructure Characterization in 2D and 3D using Advanced SEM-based Electron Diffraction Techniques. Talk presented at Chongqing University Colloquium. Chongqing, China. 2019-11-26.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0009-2AE8-3 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0009-50C2-1

Genre: Vortrag

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Urheber:
Zaefferer, Stefan¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391