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  Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi

Klaes, B., Renaux, J., Lardé, R., Delaroche, F., Morgado, F. F., Stephenson, L., et al. (2021). Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi. Microscopy and Microanalysis, 1-9. doi:10.1017/S1431927621012629.

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 Creators:
Klaes, Benjamin1, Author              
Renaux, Jeoffrey2, Author              
Lardé, Rodrigue1, Author              
Delaroche, Fabien1, Author              
Morgado, Felipe Ferraz3, Author              
Stephenson, Leigh3, Author              
Gault, Baptiste3, 4, Author              
Vurpillot, François1, 5, Author              
Affiliations:
1Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000, Rouen, France, ou_persistent22              
2Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen 76000, France, ou_persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
4Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22              
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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 Abstract: Three-dimensional field ion microscopy is a powerful technique to analyze material at a truly atomic scale. Most previous studies have been made on pure, crystalline materials such as tungsten or iron. In this article, we study more complex materials, and we present the first images of an amorphous sample, showing the capability to visualize the compositional fluctuations compatible with theoretical medium order in a metallic glass (FeBSi), which is extremely challenging to observe directly using other microscopy techniques. The intensity of the spots of the atoms at the moment of field evaporation in a field ion micrograph can be used as a proxy for identifying the elemental identity of the imaged atoms. By exploiting the elemental identification and positioning information from field ion images, we show the capability of this technique to provide imaging of recrystallized phases in the annealed sample with a superior spatial resolution compared with atom probe tomography. © 2021 Cambridge University Press. All rights reserved.

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Language(s): eng - English
 Dates: 2021
 Publication Status: Published in print
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 Rev. Type: -
 Identifiers: DOI: 10.1017/S1431927621012629
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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: New York, NY : Cambridge University Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1 - 9 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414