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  Three-Dimensional Atomically Resolved Analytical Imaging with a Field Ion Microscope

Katnagallu, S., Morgado, F. F., Mouton, I., Gault, B., & Stephenson, L. (2021). Three-Dimensional Atomically Resolved Analytical Imaging with a Field Ion Microscope. Microscopy and Microanalysis, 1-16. doi:10.1017/S1431927621012381.

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Katnagallu, Shyam1, Author           
Morgado, Felipe Ferraz1, Author           
Mouton, Isabelle1, Author           
Gault, Baptiste1, 2, Author           
Stephenson, Leigh1, Author           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22              

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 Abstract: Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has a limited structural resolution. Field ion microscopy (FIM), a predecessor technique to APT, is capable of attaining atomic resolution along certain sets of crystallographic planes albeit at the expense of elemental identification. We demonstrate how two commercially available atom probe instruments, one with a straight flight path and one fitted with a reflectron lens, can be used to acquire time-of-flight mass spectrometry data concomitant with a FIM experiment. We outline various experimental protocols making the use of temporal and spatial correlations to best discriminate field-evaporated signals from the large field-ionized background signal, demonstrating an unsophisticated yet efficient data mining strategy to provide this discrimination. We discuss the remaining experimental challenges that need to be addressed, notably concerned with accurate detection and identification of individual field-evaporated ions contained within the high field-ionized flux that contributes to a FIM image. Our hybrid experimental approach can, in principle, exhibit true atomic resolution with elemental discrimination capabilities, neither of which atom probe nor FIM can individually fully deliver - thereby making this new approach, here broadly termed analytical field ion microscopy (aFIM), unique. © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America.

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Language(s): eng - English
 Dates: 2021-08-062021
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1017/S1431927621012381
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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: New York, NY : Cambridge University Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1 - 16 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414