An expert system for improving the quality of IBA simulations by SIMNRA

Mayer, M.

Local TagsRelease HistoryDetailsSummary

An expert system for improving the quality of IBA simulations by SIMNRA

Mayer, M. (2021). An expert system for improving the quality of IBA simulations by SIMNRA. Poster presented at 25th International Conference on Ion Beam Analysis (IBA 2021) & 17th International Conference on Particle Induce X-ray Emission (PIXE) & International Conference on Secondary Ion Mass Spectrometry (SIMS), Virtual.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/21.11116/0000-0009-5940-B Version Permalink: https://hdl.handle.net/21.11116/0000-000C-989B-A

Genre: Poster

Files

show Files

Locators

show

Creators

show

hide

Creators:
Mayer, M.¹, Author

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

Content

show

Details

show

hide

Language(s): eng - English

Dates: Submitted: 2021

Publication Status: Submitted

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: 25th International Conference on Ion Beam Analysis (IBA 2021) & 17th International Conference on Particle Induce X-ray Emission (PIXE) & International Conference on Secondary Ion Mass Spectrometry (SIMS)

Place of Event: Virtual

Start-/End Date: 2021-10-11 - 2021-10-15

Legal Case

show

Project information

show

Source

show