Exploration of interfacial transitions by correlating atomic scale microscopy 
with atomistic simulations

Liebscher, Christian; Meiners, Thorsten; Peter, Nicolas J.; Frolov, Timofey; Dehm, Gerhard

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Exploration of interfacial transitions by correlating atomic scale microscopy with atomistic simulations

Liebscher, C., Meiners, T., Peter, N. J., Frolov, T., & Dehm, G. (2019). Exploration of interfacial transitions by correlating atomic scale microscopy with atomistic simulations. Talk presented at TMS 2019 Annual Meeting & Exhibition. San Antonio, TX, USA. 2019-03-10 - 2019-03-14.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0009-4D47-2 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0009-4D48-1

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Urheber:
Liebscher, Christian¹, Autor
Meiners, Thorsten², Autor
Peter, Nicolas J.¹, Autor
Frolov, Timofey³, Autor
Dehm, Gerhard², Autor

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
3Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA 94550, USA, ou_persistent22