Advanced Cs corrected STEM imaging coupled to 3D atom probe tomography

Scheu, Christina

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Advanced Cs corrected STEM imaging coupled to 3D atom probe tomography

Scheu, C. (2019). Advanced Cs corrected STEM imaging coupled to 3D atom probe tomography. Talk presented at SCANDEM 2019. Gothenburg, Sweden. 2019-06-12 - 2019-06-14.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-4D92-C Version Permalink: https://hdl.handle.net/21.11116/0000-0009-4D93-B

Genre: Talk

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Creators:
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Created: 2019-06

Publication Status: Not specified

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Title: SCANDEM 2019

Place of Event: Gothenburg, Sweden

Start-/End Date: 2019-06-12 - 2019-06-14

Invited: Yes

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