Fundamentals and Applications of Electron Energy-Loss Spectroscopy in a 
Scanning Transmission Electron Microscope

Scheu, Christina; Hieke, Stefan Werner

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Fundamentals and Applications of Electron Energy-Loss Spectroscopy in a Scanning Transmission Electron Microscope

Scheu, C., & Hieke, S. W. (2019). Fundamentals and Applications of Electron Energy-Loss Spectroscopy in a Scanning Transmission Electron Microscope. Talk presented at Universita' Roma Tre Colloquium. Roma, Italy. 2019-07-25.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-4DA1-B Version Permalink: https://hdl.handle.net/21.11116/0000-0009-50BF-6

Genre: Talk

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Creators:
Scheu, Christina¹, Author
Hieke, Stefan Werner¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Created: 2019-07-25

Publication Status: Not specified

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Title: Universita' Roma Tre Colloquium

Place of Event: Roma, Italy

Start-/End Date: 2019-07-25

Invited: Yes

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