Insights in the Structure, Defects and Stability of Mo2BC Thin Films by 
Advanced Characterization Methods

Scheu, Christina; Gleich, Stephan; Soler, Rafael; Breitbach, Benjamin; Bolvardi, Hamid; Achenbach, Jan-Ole; Schneider, Jochen Michael; Dehm, Gerhard

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Insights in the Structure, Defects and Stability of Mo₂BC Thin Films by Advanced Characterization Methods

Scheu, C., Gleich, S., Soler, R., Breitbach, B., Bolvardi, H., Achenbach, J.-O., et al. (2021). Insights in the Structure, Defects and Stability of Mo₂BC Thin Films by Advanced Characterization Methods. Talk presented at International Conference on Metallurgical Coatings and Thin Films 2021 (ICMCTF2021), Virtual Conference. 2021-04-26 - 2021-04-30.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-5006-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-5007-5

Genre: Talk

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Creators:
Scheu, Christina¹, Author
Gleich, Stephan¹, Author
Soler, Rafael², Author
Breitbach, Benjamin³, Author
Bolvardi, Hamid⁴, Author
Achenbach, Jan-Ole⁵, Author
Schneider, Jochen Michael⁴, Author
Dehm, Gerhard³, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
4Materials Chemistry, RWTH Aachen and Max-Planck-Fellow Group, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society Düsseldorf, ou_persistent13
5Materials Chemistry, RWTH Aachen University, Kopernikusstraße 10, 52074 Aachen, Germany, ou_persistent22

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Language(s): eng - English

Dates: Created: 2021-04

Publication Status: Not specified

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Title: International Conference on Metallurgical Coatings and Thin Films 2021 (ICMCTF2021), Virtual Conference

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Start-/End Date: 2021-04-26 - 2021-04-30

Invited: Yes

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