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  Determination of the position maximum for electron Compton scattering in electron microscopy

Su, D. S., Schattschneider, P., & Zeitler, E. (1994). Determination of the position maximum for electron Compton scattering in electron microscopy. Physical Review B, 49(13), 8552-8556. doi:10.1103/PhysRevB.49.8552.

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PhysRevB.49.8552.pdf (Publisher version), 228KB
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PhysRevB.49.8552.pdf
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1994
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APS
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 Creators:
Su, Dang Sheng1, Author           
Schattschneider, P.2, Author
Zeitler, Elmar1, Author           
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
2Institut für Angewandte Physik, Technische Universität Wien, Wiedner Hauptstrasse 8-10/137, A-1040 Vienna, Austria, ou_persistent22              

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 Abstract: We study electron Compton scattering with an electron microscope by means of a Castaing-Henry filter. In the electron-spectroscopic-diffraction mode the positions of the Compton maxima in the diffraction plane are determined. We find a nearly constant shift of this position with respect to the value given by E=q2/2. The intensity of Compton-scattered electrons does not peak at the scattering angle predicted by the binary collision mode. The energy dispersion of the Compton profile is well described by E=q2/2.

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Language(s): eng - English
 Dates: 1993-09-291994-04-01
 Publication Status: Issued
 Pages: 5
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevB.49.8552
 Degree: -

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Title: Physical Review B
  Abbreviation : Phys. Rev. B
Source Genre: Journal
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Publ. Info: Woodbury, NY : American Physical Society
Pages: - Volume / Issue: 49 (13) Sequence Number: - Start / End Page: 8552 - 8556 Identifier: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008