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  Atomic structure of Si(113) 3×1-H by dynamical low-energy electron diffraction intensity spectra analysis

Huang, H., Tong, S., Myler, U., & Jacobi, K. (1994). Atomic structure of Si(113) 3×1-H by dynamical low-energy electron diffraction intensity spectra analysis. Surface Review and Letters, 1(2 & 3), 221-227. doi:10.1142/S0218625X94000229.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-9F10-2 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-A914-2
Genre: Journal Article

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 Creators:
Huang, H.1, Author
Tong, S.Y.1, Author
Myler, U.2, Author           
Jacobi, Karl3, Author           
Affiliations:
1Department of Physics and Laboratory for Surface Studies, University of Wisconsin, Milwaukee WI 53201, USA, ou_persistent22              
2Fritz Haber Institute, Max Planck Society, ou_24021              
3Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              

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 Abstract: The Si((113) 3×1-H structure has been investigated by a quantitative low-energy electron diffraction intensity analysis. A model with two Si dimers in the unit cell gives best agreement between the calculation and the experimental data. Three-dimensional atomic coordinates have been determined.

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Language(s): eng - English
 Dates: 1994-04-271994
 Publication Status: Issued
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1142/S0218625X94000229
 Degree: -

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Title: Surface Review and Letters
  Other : Surf. Rev. Lett.
Source Genre: Journal
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Publ. Info: Singapore : World Scientific
Pages: 7 Volume / Issue: 1 (2 & 3) Sequence Number: - Start / End Page: 221 - 227 Identifier: ISSN: 0218-625X
CoNE: https://pure.mpg.de/cone/journals/resource/954925493953