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  Infrared super-resolution wide-field microscopy using sum-frequency generation

Niemann, R., Waßerroth, S., Lu, G., Gewinner, S., De Pas, M., Schöllkopf, W., et al. (in preparation). Infrared super-resolution wide-field microscopy using sum-frequency generation.

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arXiv:2112.08112.pdf (Preprint), 685KB
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 Creators:
Niemann, Richarda1, Author              
Waßerroth, Sören1, Author              
Lu, Guanyu2, Author
Gewinner, Sandy3, Author              
De Pas, Marco3, Author              
Schöllkopf, Wieland3, Author              
Caldwell, Joshua D.2, Author
Wolf, Martin1, Author              
Paarmann, Alexander1, Author              
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              
2Vanderbilt University, Nashville, Tennessee 37235, USA, ou_persistent22              
3Molecular Physics, Fritz Haber Institute, Max Planck Society, ou_634545              

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Free keywords: Physics, Optics, physics.optics
 Abstract: Super-resolution microscopy in the visible is an established powerful tool in several disciplines. In the infrared (IR) spectral range, however, no comparable schemes have been demonstrated to date. In this work, we experimentally demonstrate super-resolution microscopy in the IR range (λIR≈ 10-12 μm) using IR-visible sum-frequency generation. We operate our microscope in a wide-field scheme and image localized surface phonon polaritons in 4H-SiC nanostructures as a proof-of-concept. With this technique, we demonstrate an enhanced spatial resolution of ∼λIR/9, enabling to resolve the polariton resonances in individual sub-diffractional nanostructures with sub-wavelength spacing. Furthermore we show, that this resolution allows to differentiate between spatial patterns associated with different polariton modes within individual nanostructures.

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Language(s): eng - English
 Dates: 2021-12-15
 Publication Status: Not specified
 Pages: -
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 Rev. Type: -
 Identifiers: arXiv: 2112.08112
 Degree: -

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