English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse
  1. Item Summary / 
  2. View item

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
 Local TagsRelease HistoryDetailsSummary
  Lineshape asymmetry parameters in X-ray photoelectron spectra

Yarzhemsky, V., Reich, T., Chernysheva, L., Streubel, P., & Szargan, R. (1996). Lineshape asymmetry parameters in X-ray photoelectron spectra. Journal of Electron Spectroscopy and Related Phenomena, 77(1), 15-24. doi:10.1016/0368-2048(95)02382-8.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/21.11116/0000-0009-AC86-E Version Permalink: https://hdl.handle.net/21.11116/0000-0009-F792-B
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Yarzhemsky, V.G.1, Author
Reich, T.2, Author           
Chernysheva, L.V.3, Author
Streubel, P.1, Author
Szargan, R.1, Author
Affiliations:
1Institut für Physikalische und Theoretische Chemie, Universität Leipzig, Linnéstr. 2, D-04103 Leipzig, Germany, ou_persistent22              
2Fritz Haber Institute, Max Planck Society, ou_24021              
3Ioffe Physical Technical Institute of Russian Academy of Sciences, Politekhnicheskaya 26, 194021 St. Petersburg, Russia, ou_persistent22              

Content

show
hide
Free keywords: -
 Abstract: A new type of lineshape asymmetry parameter in X-ray photoelectron spectra is proposed. The widths and asymmetry parameters of 2s photoelectron lines are calculated for Mg and all atoms from Si to Sc and measured experimentally for atoms from Si to Ca. It is shown that the intrinsic asymmetry of 2s photoelectron lines due to Coster-Kronig decay is reversed with respect to the asymmetry due to inelastic photoelectron scattering and Fermi-surface relaxation. Theoretical widths of P2s and S2s photoelectron lines agree with the experimental data obtained with monochromatized Al Kα radiation.

Details

show
hide
Language(s): eng - English
 Dates: 1995-06-221994-10-181995-07-311996-02
 Publication Status: Issued
 Pages: 10
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/0368-2048(95)02382-8
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Journal of Electron Spectroscopy and Related Phenomena
  Abbreviation : J. Electron Spectrosc. Relat. Phenom.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : Elsevier B.V.
Pages: 10 Volume / Issue: 77 (1) Sequence Number: - Start / End Page: 15 - 24 Identifier: ISSN: 0368-2048
CoNE: https://pure.mpg.de/cone/journals/resource/954925524767