English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Local electrical dissipation imaged by scanning force microscopy

Denk, W., & Pohl, D. W. (1991). Local electrical dissipation imaged by scanning force microscopy. Applied Physics Letters, 59(17), 2171-2173. doi:10.1063/1.106088.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Denk, Winfried1, Author           
Pohl, D. W., Author
Affiliations:
1IBM Zurich Research Laboratory, Switzerland, ou_persistent22              

Content

show
hide
Free keywords: semiconductors spectroscopy resolution Physics
 Abstract: The low internal damping of micromachined monolithic silicon levers with integrated probe tip has been exploited to detect nonconservative components in the interaction forces between the probe tip and sample. This is accomplished by monitoring the mechanical Q while scanning the surface. The gap width was controlled by keeping the lever's resonance frequency detuning, caused by the gradient of the force between tip and surface, fixed to a preset value. Nonconservative components are present even in Coulomb attraction since, whenever a voltage is applied between tip and substrate, currents are induced by the lever's oscillation leading to Joule dissipation of energy at a rate that depends on the local conductivity. Strong damping contrast was observed in layered GaAs/AlGaAs semiconductor heterostructures. It depended on the type of material, dopant concentration, illumination, and the applied voltage. Damping variations were resolved over distances of less than 20 nm.

Details

show
hide
Language(s): eng - English
 Dates: 1991
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: Other: WOS:A1991GK72700036
DOI: 10.1063/1.106088
ISSN: 0003-6951
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 59 (17) Sequence Number: - Start / End Page: 2171 - 2173 Identifier: ISSN: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223