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Abstract:
Scattering-type scanning near-field optical microscopy enables the measurement of optical constants of a surface beyond the diffraction limit.
Its compatibility with pulsed sources is hampered by the requirement of a high-repetition rate imposed by lock-in detection. We describe a
sampling method, called quadrature-assisted discrete (quad) demodulation, which circumvents this constraint. Quad demodulation operates
by measuring the optical signal and the modulation phases for each individual light pulse. This method retrieves the near-field signal in the
pseudoheterodyne mode, as proven by retraction curves and near-field images. Measurement of the near-field using a pulsed femtosecond
amplifier and quad demodulation is in agreement with results obtained using a CW laser and the standard lock-in detection method.