Assessing runaway electron losses due to field stochasticity

Särkimäki, K.; Artola Such, F. J.; Fülöp, T.; Hoelzl, M.; Nardon, E.

Local TagsRelease HistoryDetailsSummary

Assessing runaway electron losses due to field stochasticity

Särkimäki, K., Artola Such, F. J., Fülöp, T., Hoelzl, M., & Nardon, E. (2022). Assessing runaway electron losses due to field stochasticity. Talk presented at 9th Runaway Electron Modelling (REM) Meeting. Garching. 2022-05-02 - 2022-05-06.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/21.11116/0000-000A-85C3-3 Version Permalink: https://hdl.handle.net/21.11116/0000-000A-85CA-C

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Särkimäki, K.¹, Author
Artola Such, F. J.¹, Author
Fülöp, T.², Author
Hoelzl, M.¹, Author
Nardon, E.², Author

Affiliations:
1Office of the Director (DI), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856325
2External Organizations, ou_persistent22

Content

show

Details

show

hide

Language(s): eng - English

Dates: Created: 2022

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: 9th Runaway Electron Modelling (REM) Meeting

Place of Event: Garching

Start-/End Date: 2022-05-02 - 2022-05-06

Legal Case

show

Project information

show

Source

show