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  Polarization-Dependent Sum-Frequency Generation Spectroscopy for Angstrom-Scale Depth Profiling of Molecules at Interfaces

Yu, C.-C., Seki, T., Wang, Y., Bonn, M., & Nagata, Y. (2022). Polarization-Dependent Sum-Frequency Generation Spectroscopy for Angstrom-Scale Depth Profiling of Molecules at Interfaces. Physical Review Letters, 128(22): 226001. doi:10.1103/PhysRevLett.128.226001.

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2022-06-PhysRevLett.128.226001.pdf (Publisher version), 877KB
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 Creators:
Yu, Chun-Chieh1, Author              
Seki, Takakazu1, Author              
Wang, Yongkang1, Author              
Bonn, Mischa1, Author              
Nagata, Yuki1, Author              
Affiliations:
1Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society, ou_1800285              

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Language(s): eng - English
 Dates: 2022-06-012022-06-03
 Publication Status: Published in print
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 Rev. Type: -
 Identifiers: DOI: 10.1103/PhysRevLett.128.226001
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Project name : MaxWater Initiative by the Max Planck Society
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Funding organization : Max Planck Society

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Title: Physical Review Letters
  Abbreviation : Phys. Rev. Lett.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Physical Society
Pages: - Volume / Issue: 128 (22) Sequence Number: 226001 Start / End Page: - Identifier: ISSN: 0031-9007
CoNE: https://pure.mpg.de/cone/journals/resource/954925433406_1