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  Electric-field-resolved near-infrared microscopy

Mamaikin, M., Li, Y.-L., Ridente, E., Chen, W. T., Park, J.-S., Zhu, A. Y., et al. (2022). Electric-field-resolved near-infrared microscopy. Optica, 9(6), 616-622. doi:10.1364/OPTICA.454562.

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 Creators:
Mamaikin, Mikhail1, Author           
Li , Yik-Long1, Author
Ridente, Enrico1, Author           
Chen, Wei Ting2, Author
Park, Joon-Suh2, Author
Zhu, Alexander Y.2, Author
Capasso, Federico2, Author
Weidman, Matthew1, Author           
Schultze, Martin3, Author           
Krausz, Ferenc1, Author           
Karpowicz, Nicholas3, Author           
Affiliations:
1Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              
2external, ou_persistent22              
3Attosecond Dynamics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445573              

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Language(s): eng - English
 Dates: 2022-01-212022-05-042022-06-092022-06
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1364/OPTICA.454562
Other: 6312
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Funding organization : This work was partially supported by the Air Force Office of Scientific Research, by King Abdullah University of Science and Technology (KAUST), by the Munich Centre for Advanced Photonics, and by the IMPRS-APS

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Title: Optica
  Abbreviation : Optica
Source Genre: Journal
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Publ. Info: Washington, DC, United States : The Optical Society
Pages: - Volume / Issue: 9 (6) Sequence Number: - Start / End Page: 616 - 622 Identifier: ISSN: 2334-2536
CoNE: https://pure.mpg.de/cone/journals/resource/2334-2536