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Abstract:
Applying a Keldysh Green's function method it is shown that hot electrons injected from a scanning tunneling microscope tip into a CoSi2/Si(111) system form a highly focused beam due to the silicide band structure. This explains the atomic resolution obtained in recent ballistic electron emission microscopy (BEEM) experiments. Localized surface states in the (2×1) reconstruction are found to be responsible for the also reported anticorrugation of the BEEM current. These results clearly demonstrate the importance of bulk and surface band structure effects for a detailed understanding of BEEM data.