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  Measurement of the surface strain induced by reconstructed surfaces of GaAs(001) using photoreflectance and reflectance-difference spectroscopies

Lastras-Martínez, L. F., Flores-Camacho, J. M., Lastras-Martínez, A., Balderas-Navarro, R. E., & Cardona, M. (2006). Measurement of the surface strain induced by reconstructed surfaces of GaAs(001) using photoreflectance and reflectance-difference spectroscopies. Physical Review Letters, 96(4): 047402.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-0305-8 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-0306-7
Genre: Journal Article

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 Creators:
Lastras-Martínez, L. F., Author
Flores-Camacho, J. M., Author
Lastras-Martínez, A., Author
Balderas-Navarro, R. E., Author
Cardona, M.1, Author           
Affiliations:
1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502              

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 Abstract: We report photoreflectance-difference and reflectance-difference
measurements on reconstructed GaAs (001) surfaces. From these data the
linear and quadratic electro-optic coefficient spectra are determined
in the important 2.8-3.4 eV spectral region. The surface strain and
fields induced by the surface reconstruction are also determined. We
show experimentally that between c(4x4) and (2x4) surfaces, there is an
inversion of the surface electric field which we attribute to a direct
piezo-electric effect related to the surface strain induced by
reconstruction.

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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 273449
ISI: 000235083600103
 Degree: -

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Title: Physical Review Letters
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 96 (4) Sequence Number: 047402 Start / End Page: - Identifier: ISSN: 0031-9007