Thickness dependence of the superconducting properties of ultra thin Bi2Sr2CaCu2
O8+x single crystals

You, L. X.; Yurgens, A.; Winkler, D.; Lin, C. T.; Liang, B.

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Thickness dependence of the superconducting properties of ultra thin Bi₂Sr₂CaCu₂O_8+x single crystals

You, L. X., Yurgens, A., Winkler, D., Lin, C. T., & Liang, B. (2006). Thickness dependence of the superconducting properties of ultra thin Bi₂Sr₂CaCu₂O_8+x single crystals. Superconductor Science and Technology, 19, S205-S208.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-01CF-7 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-01D0-4

Genre: Journal Article

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Creators:
You, L. X., Author
Yurgens, A., Author
Winkler, D., Author
Lin, C. T.¹, Author
Liang, B.^{1, 2}, Author

Affiliations:
1Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370496
2Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370480

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Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 285758

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Title: Superconductor Science and Technology

Source Genre: Journal

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Pages: - Volume / Issue: 19 Sequence Number: - Start / End Page: S205 - S208 Identifier: -