Detection of ellipses in Powder diffraction patterns using hough transformation

Paneerselvam, R.; Hinrichsen, B.; Joswig, M.; Dinnebier, R. E.; Jansen, M.

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Detection of ellipses in Powder diffraction patterns using hough transformation

Paneerselvam, R., Hinrichsen, B., Joswig, M., Dinnebier, R. E., & Jansen, M. (2006). Detection of ellipses in Powder diffraction patterns using hough transformation. Zeitschrift für Kristallographie, Supplement, 24: 132.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-FF49-2 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-FF4A-1

Genre: Journal Article

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Creators:
Paneerselvam, R.¹, Author
Hinrichsen, B.¹, Author
Joswig, M.², Author
Dinnebier, R. E.¹, Author
Jansen, M.³, Author

Affiliations:
1Scientific Facility X-Ray Diffraction (Robert E. Dinnebier), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370494
2Max Planck Society, ou_persistent13
3Abteilung Jansen, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370503

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 374163

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Title: Zeitschrift für Kristallographie, Supplement

Source Genre: Journal

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Pages: - Volume / Issue: 24 Sequence Number: 132 Start / End Page: - Identifier: -