Coulomb blockade phenomena in electromigration break junctions

Sordan, R.; Balasubramanian, K.; Burghard, M.; Kern, K.

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Coulomb blockade phenomena in electromigration break junctions

Sordan, R., Balasubramanian, K., Burghard, M., & Kern, K. (2005). Coulomb blockade phenomena in electromigration break junctions. Applied Physics Letters, 87(1): 013106.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-FD1A-9 Version Permalink: https://hdl.handle.net/21.11116/0000-000E-FD1B-8

Genre: Journal Article

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Creators:
Sordan, R.¹, Author
Balasubramanian, K.¹, Author
Burghard, M.¹, Author
Kern, K.¹, Author

Affiliations:
1Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370481

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Identifiers: eDoc: 244490
ISI: 000230277900044

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 87 (1) Sequence Number: 013106 Start / End Page: - Identifier: ISSN: 0003-6951