Bi2Sr2CaCu2O8+δ intrinsic Josephson junctions: Surface layer characterization 
and control

Zhao, S. P.; Zhu, X. B.; Wei, Y. F.; Chen, G. H.; Yang, Q. S.; Lin, C. T.

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Bi₂Sr₂CaCu₂O_8+δ intrinsic Josephson junctions: Surface layer characterization and control

Zhao, S. P., Zhu, X. B., Wei, Y. F., Chen, G. H., Yang, Q. S., & Lin, C. T. (2005). Bi₂Sr₂CaCu₂O_8+δ intrinsic Josephson junctions: Surface layer characterization and control. Physical Review B, 72(18): 184511.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-00DD-8 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-00DE-7

Genre: Journal Article

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Creators:
Zhao, S. P., Author
Zhu, X. B., Author
Wei, Y. F., Author
Chen, G. H., Author
Yang, Q. S., Author
Lin, C. T.¹, Author

Affiliations:
1Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370496

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Identifiers: eDoc: 250310
ISI: 000233603600075

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Title: Physical Review B

Source Genre: Journal

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Pages: - Volume / Issue: 72 (18) Sequence Number: 184511 Start / End Page: - Identifier: -