VUV-ellipsometry on GaN: Probing conduction band properties by core level 
excitations

Esser, N.; Rakel, M.; Cobet, C.; Schmidt, W. G.; Braun, W.; Cardona, M.

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VUV-ellipsometry on GaN: Probing conduction band properties by core level excitations

Esser, N., Rakel, M., Cobet, C., Schmidt, W. G., Braun, W., & Cardona, M. (2005). VUV-ellipsometry on GaN: Probing conduction band properties by core level excitations. physica status solidi (b), 242(13), 2601-2609.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000E-FCA4-D Version Permalink: https://hdl.handle.net/21.11116/0000-000E-FCA5-C

Genre: Journal Article

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Creators:
Esser, N.¹, Author
Rakel, M., Author
Cobet, C., Author
Schmidt, W. G., Author
Braun, W.², Author
Cardona, M.¹, Author

Affiliations:
1Former Departments, Max Planck Institute for Solid State Research, Max Planck Society, ou_3370502
2Department Solid State Quantum Electronics (Jochen Mannhart), Max Planck Institute for Solid State Research, Max Planck Society, ou_3370485

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Identifiers: eDoc: 250392
ISI: 000233229400011

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Title: physica status solidi (b)

Source Genre: Journal

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Pages: - Volume / Issue: 242 (13) Sequence Number: - Start / End Page: 2601 - 2609 Identifier: -