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Abstract:
We examine the phase and the period of the radiation-induced
oscillatory magnetoresistance in GaAs/AlGaAs devices utilizing in situ
magnetic field calibration by electron spin resonance of
diphenyl-picryl-hydrazal. The results confirm a f-independent 1/4-cycle
phase shift with respect to the hf = j (h) over bar omega(c) condition
for j greater than or equal to 1, and they also suggest a small
(approximate to2%) reduction in the effective mass ratio, m*/m, with
respect to the standard value for GaAs/AlGaAs devices.